characteristic |
Independently controllable pure domestically produced core components |
Domestic consumables with lower operating costs |
Split type airflow channel simplifies equipment maintenance |
Excellent uniformity of epitaxial wafers, with uniformity<2% |
Excellent flow field, temperature field uniformity, and control stability |
Automated operating system and visual data analysis system |
Equipped with advanced in-situ detection system |
Technical Parameter | |
Type of cavity | Vertical reactor, tray controllable rotation system |
Pressure Range | 0-600 kPa |
Wafer size | 37X2 inch, 7X4 inch, 3X6 inch, 1X8 inch, 1X12 inch |
Gas source configuration | 8 metal organic source pipelines, 4 hydride pipelines |
Heating system | Three temperature zone heating, with a maximum temperature of 1300 ℃ |
Equipment size | 6150*1200*2300 (mm) |